New Soft X-Ray Reflectometer on Beijing Synchrotron Radiation Facility and Some Basic Results of Physics Work

Cui Mingqi; Wang Jun; Miao Jianwei; Huang Yuying; Tang Esheng; Xian Dingchang; Shao Jinghong; Xue Song; Xu Zhengliang; Sun Jianhui

Chinese Physics C> 1995, Vol. 19> Issue(1) : 82-86

New Soft X-Ray Reflectometer on Beijing Synchrotron Radiation Facility and Some Basic Results of Physics Work

Institute of High Energy Physics, The Chinese Academy of Sciences, Beijing 1000391 Changchun Institute of Optics and Fine Mechanics, Academia Sinica, Changchun 130022

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Abstract：
This paper describes the new soft X-ray reflectometer with multilayer monochromator on beam line 3B1 of Beijing Synchrotron Radiation Facility (BSRF). The transmitted spectrum of aluminum filter and reflected spectrum of Nb/Si multilayer in soft X-ray region have been analysed with this reflectometer. The reflectivity of a Nb/Si multilayer manufactured in our group (41 layers, d = 13.45 and wavelength near 17.59um at 42 deg.) has been measured to be 32%.

References

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Cui Mingqi, Wang Jun, Miao Jianwei, Huang Yuying, Tang Esheng, Xian Dingchang, Shao Jinghong, Xue Song, Xu Zhengliang and Sun Jianhui. New Soft X-Ray Reflectometer on Beijing Synchrotron Radiation Facility and Some Basic Results of Physics Work[J]. Chinese Physics C, 1995, 19(1): 82-86.

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Received: 1900-01-01
Revised: 1900-01-01

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通讯作者: 陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

New Soft X-Ray Reflectometer on Beijing Synchrotron Radiation Facility and Some Basic Results of Physics Work

Corresponding author: Cui Mingqi,

Institute of High Energy Physics, The Chinese Academy of Sciences, Beijing 1000391 Changchun Institute of Optics and Fine Mechanics, Academia Sinica, Changchun 130022

Received Date: 1900-01-01

Accepted Date: 1900-01-01

Available Online: 1995-01-05

Abstract: This paper describes the new soft X-ray reflectometer with multilayer monochromator on beam line 3B1 of Beijing Synchrotron Radiation Facility (BSRF). The transmitted spectrum of aluminum filter and reflected spectrum of Nb/Si multilayer in soft X-ray region have been analysed with this reflectometer. The reflectivity of a Nb/Si multilayer manufactured in our group (41 layers, d = 13.45 and wavelength near 17.59um at 42 deg.) has been measured to be 32%.

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New Soft X-Ray Reflectometer on Beijing Synchrotron Radiation Facility and Some Basic Results of Physics Work

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