Study of the background in the experiments of inner-shell ionization of atoms by positron impact
- Received Date: 2008-07-17
- Accepted Date: 1900-01-01
- Available Online: 2008-01-03
Abstract: One of main difficulties in the experiments of inner-shell ionization of atoms by positron impact near threshold energy region is the relatively high low-energy background, which is caused by the deposited part of energy in semi-conductor X-ray detectors of 0.511 MeV γ rays that are produced by positron annihilations in targets and target chamber. In this paper, by using the Monte Carlo method, we simulated the backgrounds for the X-ray detectors with the sensitive layer thickness of 0.3 mm and 3 mm in the case of 0.511 MeV γ rays impacting vertically on a Ti plate of 0.2 mm in thickness, and compared the simulation results with the experimental observations of the other research group and our own. Moreover, we also simulated the backgrounds for a simplified experimental setup in the case of 20 keV positrons impacting vertically on a thick Ti target and observed that the backgrounds for the X-ray detectors with the sensitive layer thickness of 0.3 mm and 3 mm, are very similar.