Statistic Analysis of the Deposited Energy in Single Event Upset Induced by 10—20MeV Neutrons

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LI Hua. Statistic Analysis of the Deposited Energy in Single Event Upset Induced by 10—20MeV Neutrons[J]. Chinese Physics C, 2006, 30(12): 1238-1241.
LI Hua. Statistic Analysis of the Deposited Energy in Single Event Upset Induced by 10—20MeV Neutrons[J]. Chinese Physics C, 2006, 30(12): 1238-1241. shu
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Received: 2006-07-10
Revised: 1900-01-01
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    沈阳化工大学材料科学与工程学院 沈阳 110142

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Statistic Analysis of the Deposited Energy in Single Event Upset Induced by 10—20MeV Neutrons

    Corresponding author: LI Hua,
  • Department of Physics, Jinan University, Guangzhou 510632, China

Abstract: Based on Monte Carlo simulations, the deposited energies in the single event upset induced by 10—20MeV neutrons in SRAM silicon chip are been statistically analysed. It can provide statistic information about the deposited energy for understanding the random process of the single event upset.

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