Emittance Measurement of Highly Charged Ion Beams Extracted from ECR Ion Source Using Electric Sweep Scanner

CAO Yun; MA Lei; ZHAO Hong-Wei; ZHANG Zi-Min; SUN Liang-Ting; LI Jing-Yu; FENG Yu-Cheng; LI Xi-Xia

Chinese Physics C> 2004, Vol. 28> Issue(8) : 885-888

Emittance Measurement of Highly Charged Ion Beams Extracted from ECR Ion Source Using Electric Sweep Scanner

Institute of Modern Physics,The Chinese Academy of Sciences,Lanzhou 730000,China

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Abstract：
We have designed and built an emittance scanner which was installed at the beam line LECR3 of the heavy Ion Accelerator Facility in Lanzhou.The scanner measures the emittance of beams from the ECR ion source by the electric-sweep method,named as Electric-Sweep Scanner(ESS).From analyzing the measured results we found it is contrary to the behavior expected from normal theory of ECR plasma.Typical results are as follows:when the extracted voltage is 15.97kV,total current is 190μA,the horizontal and vertical emittance of O⁴⁺ are 137πmm·mrad and 120πmm·mrad respectively.

References

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CAO Yun, MA Lei, ZHAO Hong-Wei, ZHANG Zi-Min, SUN Liang-Ting, LI Jing-Yu, FENG Yu-Cheng and LI Xi-Xia. Emittance Measurement of Highly Charged Ion Beams Extracted from ECR Ion Source Using Electric Sweep Scanner[J]. Chinese Physics C, 2004, 28(8): 885-888.

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Received: 2003-12-08
Revised: 1900-01-01

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