Strong Electronic Excitation Effect of Swift Heavy Ions on C60 Films
- Received Date: 2003-08-21
- Accepted Date: 1900-01-01
- Available Online: 2004-07-05
Abstract: Strong electronic excitation effect of C60 films induced by 2.0 GeV 136Xe and 2.7GeV 238U ions was investigated by means of Fourier transform infrared (FTIR), Raman Scattering and X-ray diffraction (XRD) spectroscopies. A new peak located at 670 cm－1, which corresponds to an unknown structure, was observed in the FTIR spectra of C60 films irradiated for the first time. The variation in intensity of 670 cm－1 peak with electronic energy loss and irradiation dose were studied. The analysis results indicated that electronic energy transfer dominates the damage process of C60 films. The partial recovery of the damage in irradiated C60 films at middle electronic energy loss is attributed to an annealing effect of the strong electronic excitation. The ion velocity also plays a role in the process of the damage creation.