Dependence on Temperature and Voltage of MRPC Noise and Dark Current

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ZHAO Yan-E, WANG Xiao-Lian, LIU Hai-Dong, CHEN Hong-Fang, LI Cheng, WU Jian, XU Zi-Zong, SHAO Ming, ZENG Hui and ZHOU Yi. Dependence on Temperature and Voltage of MRPC Noise and Dark Current[J]. Chinese Physics C, 2004, 28(11): 1193-1196.
ZHAO Yan-E, WANG Xiao-Lian, LIU Hai-Dong, CHEN Hong-Fang, LI Cheng, WU Jian, XU Zi-Zong, SHAO Ming, ZENG Hui and ZHOU Yi. Dependence on Temperature and Voltage of MRPC Noise and Dark Current[J]. Chinese Physics C, 2004, 28(11): 1193-1196. shu
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Received: 2004-03-27
Revised: 1900-01-01
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Dependence on Temperature and Voltage of MRPC Noise and Dark Current

    Corresponding author: WANG Xiao-Lian,
  • Department of Modern Physics,University of Science and Technology of China,Hefei 230026,China

Abstract: With different gas mixtures and high voltage, the temperature dependence of the noise and dark current for a 6-gap Multi-gap Resistive Plate Chamber (MRPC) is measured, and they are found to increase exponentially with the increase of temperature.

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