Analysis of the microbunching instability in a mid-energy electron linac

HUANG Da-Zhang; GU Qiang; WANG Zhen; ZHANG Meng; King Yuen

doi:10.1088/1674-1137/39/3/038101

Chinese Physics C> 2015, Vol. 39> Issue(3) : 038101 DOI: 10.1088/1674-1137/39/3/038101

Analysis of the microbunching instability in a mid-energy electron linac

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Abstract：
Microbunching instability usually exists in the linear accelerator (linac) of a free electron laser (FEL) facility. If it is not controlled effectively, the beam quality will be damaged seriously and the machine will not operate properly. In the electron linac of a soft X-ray FEL device, because the electron energy is not very high, the problem can become even more serious. As a typical example, the microbunching instability in the linac of the proposed Shanghai Soft X-ray Free Electron Laser facility (SXFEL) is investigated in detail by means of both analytical formulae and simulation tools. In the study, a new mechanism introducing random noise into the beam current profile as the beam passes through a chicane-type bunch compressor is proposed. The higher-order modes that appear in the simulations suggest that further improvement of the current theoretical model of the instability is needed.

References

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HUANG Da-Zhang, GU Qiang, WANG Zhen, ZHANG Meng and King Yuen. Analysis of the microbunching instability in a mid-energy electron linac[J]. Chinese Physics C, 2015, 39(3): 038101. doi: 10.1088/1674-1137/39/3/038101

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Received: 2014-05-06
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

Analysis of the microbunching instability in a mid-energy electron linac

Corresponding author: HUANG Da-Zhang,

Received Date: 2014-05-06
Accepted Date: 1900-01-01
Available Online: 2015-03-05

Abstract: Microbunching instability usually exists in the linear accelerator (linac) of a free electron laser (FEL) facility. If it is not controlled effectively, the beam quality will be damaged seriously and the machine will not operate properly. In the electron linac of a soft X-ray FEL device, because the electron energy is not very high, the problem can become even more serious. As a typical example, the microbunching instability in the linac of the proposed Shanghai Soft X-ray Free Electron Laser facility (SXFEL) is investigated in detail by means of both analytical formulae and simulation tools. In the study, a new mechanism introducing random noise into the beam current profile as the beam passes through a chicane-type bunch compressor is proposed. The higher-order modes that appear in the simulations suggest that further improvement of the current theoretical model of the instability is needed.