Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL

Get Citation
SUN Da-Rui, XU Jin-Qiang and CHEN Sen-Yu. Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL[J]. Chinese Physics C, 2010, 34(2): 227-230. doi: 10.1088/1674-1137/34/2/014
SUN Da-Rui, XU Jin-Qiang and CHEN Sen-Yu. Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL[J]. Chinese Physics C, 2010, 34(2): 227-230.  doi: 10.1088/1674-1137/34/2/014 shu
Milestone
Received: 2009-06-24
Revised: 2009-07-14
Article Metric

Article Views(2526)
PDF Downloads(587)
Cited by(0)
Policy on re-use
To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.
通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

  1. 本站搜索
  2. 百度学术搜索
  3. 万方数据库搜索
  4. CNKI搜索

Email This Article

Title:
Email:

Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL

    Corresponding author: SUN Da-Rui,

Abstract: 

The Electro-optical sampling delay scanning technique can be used for electron beam bunch length measurement. A novel non-ynchronous delay scanning technique based on the electro-optical sampling measurements is presented. Based on Beijing Free Electron Laser (BFEL), the electron beam bunch length was measured with the electro-optical sampling technique for the first time in China. The result shows that the electron beam bunch length at BFEL is about 5.6±1.2 ps.

    HTML

Reference (1)

目录

/

DownLoad:  Full-Size Img  PowerPoint
Return
Return