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Chinese Physics C> 2013, Vol. 37> Issue(1) : 018202 DOI: 10.1088/1674-1137/37/1/018202

Statistical distribution based detector response function ofSi (PIN) detector for Kα and Kβ X-ray

  • A semi-empirical detector response function (DRF) model of Si (PIN) detector is proposed to fit element Kα and Kβ X-ray spectra, which is based on statistical distribution analytic (SDA) method. The model for each single peak contains a step function, a Gaussian function and an exponential tail function. Parameters in the model are obtained by weighted nonlinear least-squares fitting method. In the application, six kinds of elements' characteristic X-ray spectra are obtained by Si (PIN) detector, and fitted out by the established DRF model. Reduced chi-square values are at the interval of 1.11-1.25. Other applications of the method are also discussed.
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    [1] Cengiz A. Appl. Radiat. Isot, 2008, 66: 1371[2] Scholze F, Procop M. X-Ray Spectrom, 2009, 38: 312[3] Roet D, Vanespen P. Nucl. Instrum. Methods Phys. Res B, 2010, 268: 2794[4] LI F, HAN X. Appl. Radiat. Isot, 2012, 70: 1175[5] WANG J, WANG Z, Peeples J et al. Appl. Radiat. Isot, 2012, 70: 1166[6] Scholze F, Procop M. X-Ray Spectrom, 2001, 30: 69[7] LI F, Gardner R P. Appl. Radiat. Isot, 2012, 70: 1243[8] Gardner R P, LI F. X-Ray Spectrom, 2011, 40: 405[9] Yacout A M, Gardner R P, Verghese K. Nucl. Instrum. Methods Phys. Res. A, 1986,243: 121[10] Scholze F, Procop M. X-Ray Spectrom, 2009, 38: 312[11] Alves L C, Jesus A E, Reis M A. Nucl. Instrum. Methods Phys. Res. B, 1996, 109/110: 129[12] Campbell J L, McDonald L, Hopman T et al. X-Ray Spectrom, 2001,30: 230[13] TUO Xian-Guo, LI Zhe, YI Cheng et al. Appl. Radiat. Isot, 2010, 68: 647[14] LI Zhe, TUO Xian-Guo, YANG Jian-Bo et al. Spectrosc. Spectr. Anal., 2010, 30: 2842 (in Chinese)[15] LI Zhe, TUO Xian-Guo, YANG Jian-Bo et al. Methods of Detector Response Function Establishment in X-ray Fluorescence Spectra Analysis. Spectrosc. Spectr. Anal., to be published (in Chinese)[16] Campbell J L, Maxwell J A, Andrushenko S M et al. Nucl. Instrum. Methods Phys. Res. B, 2011, 269: 57[17] ZHU Yong-Sheng. Probability and Statistics in Experiment Physics. Beijing: Science Press, 2006[18] Gardner R P, Moster J M. Nucl Instrum. Methods 1982, 198: 381[19] HE T, Gardner R P, Verghese K. Instrum. Methods Phys. Res. A. 1990, 299: 354[20] Lowe B G, Sareen R A. Nucl. Instrum. Methods Phys. Res. A, 2007, 576: 367[21] ZHOU Jian-Bin. The Research and Development of Low-Z Elements EDXRF Analyzer (Ph.D.Thesis). Chengdu: Chengdu University of Technology, 2008 (in Chinese)[22] Sood A, Gardner R P. Nucl. Instrum. Methods Phys. Res. B, 2004, 213: 100[23] Scholze F, Procop M. X-Ray Spectrom, 2009, 38: 312[24] Tomal A, Cunha D M, Antoniassi M et al. Appl. Radiat. Isot, 2011, 70: 1355[25] Yosuke I, Kunihiro S, Hideki M. Nucl. Instrum. Methods Phys. Res. B, 1987, 27: 353[26] Lowe B G, Sareen R A. Nucl. Instrum. Methods Phys. Res. A, 2007, 576: 367

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LI Zhe, TUO Xian-Guo, YANG Jian-Bo, LIU Ming-Zhe, CHENG Yi and WANG Lei. Statistical distribution based detector response function ofSi (PIN) detector for Kα and Kβ X-ray[J]. Chinese Physics C, 2013, 37(1): 018202. doi: 10.1088/1674-1137/37/1/018202
LI Zhe, TUO Xian-Guo, YANG Jian-Bo, LIU Ming-Zhe, CHENG Yi and WANG Lei. Statistical distribution based detector response function ofSi (PIN) detector for Kα and Kβ X-ray[J]. Chinese Physics C, 2013, 37(1): 018202.  doi: 10.1088/1674-1137/37/1/018202 shu
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Received: 2012-03-02
Revised: 2012-08-16
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Statistical distribution based detector response function ofSi (PIN) detector for Kα and Kβ X-ray

    Corresponding author: TUO Xian-Guo,
  • Received Date: 2012-03-02
  • Accepted Date: 2012-08-16
  • Available Online: 2013-01-05

Abstract: A semi-empirical detector response function (DRF) model of Si (PIN) detector is proposed to fit element Kα and Kβ X-ray spectra, which is based on statistical distribution analytic (SDA) method. The model for each single peak contains a step function, a Gaussian function and an exponential tail function. Parameters in the model are obtained by weighted nonlinear least-squares fitting method. In the application, six kinds of elements' characteristic X-ray spectra are obtained by Si (PIN) detector, and fitted out by the established DRF model. Reduced chi-square values are at the interval of 1.11-1.25. Other applications of the method are also discussed.

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