Correlated Data Fitting and Error Analysis in ψ(2S) Scan Experiment

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MO Xiao-Hu and ZHU Yong-Sheng. Correlated Data Fitting and Error Analysis in ψ(2S) Scan Experiment[J]. Chinese Physics C, 2003, 27(6): 474-478.
MO Xiao-Hu and ZHU Yong-Sheng. Correlated Data Fitting and Error Analysis in ψ(2S) Scan Experiment[J]. Chinese Physics C, 2003, 27(6): 474-478. shu
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Received: 2002-09-23
Revised: 1900-01-01
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Correlated Data Fitting and Error Analysis in ψ(2S) Scan Experiment

    Corresponding author: MO Xiao-Hu,
  • Institute of High Energy Physics, CAS, Beijng 100039, China2 China Center of Advanced Science and Technology, Beijing 100080, China

Abstract: Maximum likelihood method is adopted to acquire the fitting formula, which could deal with the correlations between different points and different channels in ψ(2S) scan experiment. Sampling technique is employed to avoid the difficulty of too many fitting parameters. The final error of the fitted value is the combination of all kinds of uncertainties. The approach described in this paper could effectively treat the complex correlation problem in experiment data analysis.

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