THE NUMERICAL CALCULATION USED IN THICK TARGET PIXE ANALYSES

FAN Qin-Min; Zhong Ming

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2024年10月30日

Chinese Physics C> 1988, Vol. 12> Issue(1) : 6-11

THE NUMERICAL CALCULATION USED IN THICK TARGET PIXE ANALYSES

FAN Qin-Min ^, ,
Zhong Ming

Institute of High Energy Physics,Academia Sinica

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Abstract：
The numerical calculation were used to correct the measured K X-ray intensities in thick target PIXE analyses for the following matrix effects: slowing down of protons,absorption of characteristic X-ray,and X-ray induced X-ray emission in the sample.The efficiency calibrations for PIXE analysis system were made by means of the Monte Carlo technique.Based on these corrections and calibrations,the PIXE analysis results on some thick speciments made by ourself were obtained without the use of standard and they showed a good agreement between the measured and the known values of contents.

References

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P. M. A. Van der Kam et al., N. I. M. 142(1977), 55.[2] 0. Meyer et al, "Ion Beam Surface Layer Analysis" (1976).[3] A. E. Johansson et al., N. 1. M. 137(1976), 473.[4] M. S. Ahlberg, N. I. M. 142(1977), 61.[5] R. Akselsson and T. B. Johansson, Z. Physik, 266(1974), 245.[6] 范钦敏等, 核技术, No.3(1985), 15.[7] M. Khaliquzzaman et al., N. I. M. 216(1983), 481.

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FAN Qin-Min and Zhong Ming. THE NUMERICAL CALCULATION USED IN THICK TARGET PIXE ANALYSES[J]. Chinese Physics C, 1988, 12(1): 6-11.

FAN Qin-Min and Zhong Ming. THE NUMERICAL CALCULATION USED IN THICK TARGET PIXE ANALYSES[J]. Chinese Physics C, 1988, 12(1): 6-11. shu

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Received: 1900-01-01
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

THE NUMERICAL CALCULATION USED IN THICK TARGET PIXE ANALYSES

FAN Qin-Min ^,
Zhong Ming

Corresponding author: FAN Qin-Min,

Institute of High Energy Physics,Academia Sinica

Received Date: 1900-01-01
Accepted Date: 1900-01-01
Available Online: 1988-02-05

Abstract: The numerical calculation were used to correct the measured K X-ray intensities in thick target PIXE analyses for the following matrix effects: slowing down of protons,absorption of characteristic X-ray,and X-ray induced X-ray emission in the sample.The efficiency calibrations for PIXE analysis system were made by means of the Monte Carlo technique.Based on these corrections and calibrations,the PIXE analysis results on some thick speciments made by ourself were obtained without the use of standard and they showed a good agreement between the measured and the known values of contents.