Study on Pores and Defect by Synthrotron Radiation Small Angle Reflection Method and Slow Positron Annihilation Technique

ZHOU Chun-Lan; WANG Dan-Ni; HE Chuang-Xin; WANG Bao-Yi; WEI Long; HE Qing; JIA Quan-Jie

Chinese Physics C> 2003, Vol. 27> Issue(S1) : 67-71

Study on Pores and Defect by Synthrotron Radiation Small Angle Reflection Method and Slow Positron Annihilation Technique

Institute of High Energy Physics,CAS,Beijing 100039,China

Abstract
HTML
Reference
Related

PDF

Abstract：
We measured the X-ray small angle refection (XRR) in Beijing Synchrotron Radiation facility (BSRF) and the Doppler broaden of positron in Beijing slow positron beam with ²²Na radiation source for pore SiO_x(1≤x≤1.6) film prepared by radio-frequency sputtering at different Ar pressures.The result of XRR showed that with the Ar pressures increasing,densities of films were decreasing and porosity were increasing.Positron annihilation result S parameters were decreasing with Ar increasing,this contributed to the paramagnetic defect E' center reducing Ps production.Comparing with the thickness of films with XRR method and slow positron annihilation analyzing program VEPFIT,it showed that the results were consistency and the result of VEPFIT was samller.

References

[1]

ZHENC: W et al. J. Appl. Polym. Sci. ,2002,83 : 1862 Koshizaki N , Yasumoto K, Terauchi S. Jpn. J. Appl. Phys. ,1995 ,34(Suppl. 34-1 ) :1193 Kimerling L C et al. Solid State. phys. ,1996,50 :3334 Miller R D. Science, 1999,286 :4215 Asoka-Kumar P, Lynn K G,Welch D 0. J. Appl. Phys. , 1994,76:49356 Petkov M P et al. Appl. Phys. Lett., 2002,79 :38847 SUN J N et al. Appl. Phys. Lett. ,2002,81: 14478 WU Wen-Li et al. Lynn, J. Appl. Phys. ,2000,87(3) :I1939 Eric K. Appl. Phys. Lett. ,2002,81 (4) : 60710 YU R S et al. Jour. Appl. Phys. ,2003,93(6) :334011 Hinds B J et al. Journal of Non-Crystalline Solids,1998,227-230:507-51212 REFSIM Version 1. 2, User ' s Manual, Bruker Analytical X-raySyslems, 199813 Physics Reports 257,223-348 :26614 Mills A P et al. Phys. Rev. , 1982 ,A26 :49015 Vehanen A. Apll. Phys. , 1987, A43 :26916 Lynn K G ,Lutz H. Phys. Rev. ,1980, B22:414317 HE Y J et al. Phys. Rev. ,1986, B33 :5924

[1]	ZHOU Chun-Lan , ZHANG Tian-Bao , MA Chuang-Xing , ZHANG Zhi-Ming , CAO Xing-Zhong , WANG Bao-Yi , WEI Long . The Analysis of 3γ/2γ in the Measurement of Positron Annihilation Doppler-broadening Spectroscopy. Chinese Physics C, 2006, 30(1): 84-87.
[2]	WEI Cun-Feng , WANG Bao-Yi , WANG Ping , CAO Xing-Zhong , ZHANG Zhi-Ming , MA Yan-Yun , XUE De-Sheng , WEI Long . A Device Used in Pulsed Slow Positron Beam's Stretching. Chinese Physics C, 2006, 30(10): 1010-1013.
[3]	CAO Xing-Zhong , WANG Bao-Yi , WANG Ping , MA Yan-Yun , QIN Xiu-Bo , WEI Long . Performance of Beijing Intense Slow Positron Beam. Chinese Physics C, 2006, 30(12): 1196-1199.
[4]	MA Yan-Yun , PEI Shi-Lun , CAO Xing-Zhong , WANG Ping , WEI Cun-Feng , MA Chuang-Xing , ZHANG Zhi-Ming , WANG Shu-Hong , WANG Bao-Yi , WEI Long . Design of a Pulsed Low Energy Positron System Based on Beijing Intense Slow Positron Beam. Chinese Physics C, 2006, 30(2): 166-170.
[5]	GONG Yan , CHEN Bo , NI Qi-Liang , CUI Ming-Qi , ZHAO Yi-Dong , WU Zhong-Hua . Thickness Analysis for Thin-Film by Glazing Exit X-ray Fluorescence With Synchrotron Radiation Source. Chinese Physics C, 2005, 29(11): 1104-1106.
[6]	ZHANG Hui , WANG Bao-Yi , ZHANG Zhe , WANG Ping , WEI Long , JIA Quan-Jie , WANG Yu-Zhu . Experimental studies on FeS₂ films prepared on Si (100) substrates by synchrotron radiation surface X-ray diffraction method. Chinese Physics C, 2005, 29(S1): 32-36.
[7]	SHEN Da-Wa , YU Hui , WU Zong-Hua , HUANG Yong . The Morphology of CDA-g-PMMA Copolymers in Solution Studied by SR-SAXS. Chinese Physics C, 2005, 29(S1): 8-11.
[8]	CAO Xing-Zhong , WANG Bao-Yi , YU Run-Sheng , WEI Cun-Feng , XUE De-Sheng , WEI Long . Design of the Magnetic Field System for Beijing Intense Slow Positron Beam Transportation. Chinese Physics C, 2004, 28(5): 560-563.
[9]	YU Run-Sheng , WANG Bao-Yi , MA Chuang-Xin , CAO Xing-Zhong , PEI Guo-Xi , WEI Long , YE Ming-Han . Computer Simulation for the Real-Sized Electron-Positron Converter on BEPC-LINAC Based Slow Positron Beam. Chinese Physics C, 2001, 25(S1): 135-139.
[10]	Ju Xin , Peng Liangqiang , Deng Bin , Weng Huimin , Han Rongdian . Study on Lithium Fluoride Cluster-Based Nanophase Films by Low Energy Positron Beam. Chinese Physics C, 1997, 21(9): 844-850.
[11]	Huang Maorong , Wang Yunyu , Yang Juhua , He Yongshu , Guo Yinghuan , Sun Tonghan . Study on InP Doped With Sulphur and Under DifferentTemperatures by Positron Annihilation. Chinese Physics C, 1996, 20(12): 1097-1102.
[12]	He Yuanjin , Xin Mingrui , Zhang Tianbao . Measurement of Characteristic Positron Annihilation Lifetime in HgCdTe. Chinese Physics C, 1994, 18(8): 752-756.
[13]	WENG Hu-Min , ZHOU Xian-Yi , XU Ji-Hua , SUN Shi-Jun , ZHU Jing-Sheng , WU Shu-Lan , HAN Rong-Dian . Microstructure of A1/GaAs Interface Studied by Slow Positron Beam. Chinese Physics C, 1993, 17(9): 775-783.
[14]	ZHOU Xian-Yi , ZHANG Han , YUAN Song-Liu , WANG Shun-Xi , ZHU Jing-Sheng , ZHANG Qi-Rui . 1D-ACAR Spectra of YBa_2－xSr_xCu₃O_y. Chinese Physics C, 1991, 15(11): 961-965.
[15]	ZHANG Duan-Ming , LI Guo-Yuan , WANG Jian-An , HE Yuan-Jin . POSITRON ANNIHILATION STUDY OF PHASE TRANSITION IN HIGH-TEMPERATURE SUPERCONDUCTOR Y-Ba-Cu-O. Chinese Physics C, 1989, 13(9): 769-771.
[16]	SHEN Ji-Qiang , LONG Qi-Wei , ZHOU Jin , WANG Ke-Lin . ATOMIC DENSITY DISTRIBUTIONS OF GRAIN BOUNDARIES IN METALS AND CHARACTERISTICS OF POSITRON ANNIHILATION LIFETIME SPECTRA. Chinese Physics C, 1989, 13(10): 879-885.
[17]	XIONG Liang-Yue . A PHENOMENOLOGICAL MODEL FOR POSITRON TRAPPING AT DISLOCATIONS. Chinese Physics C, 1988, 12(4): 433-439.
[18]	XIONG Liang-Yue(L.Y.Xiong) . THE ACCURATE DETERMINATION OF SMALL VARIATIONS FOR THE PARAMETERS OF POSITRON LIFETIME SPECTRA IN AMORPHOUS ALLOY. Chinese Physics C, 1986, 10(5): 513-518.
[19]	XIONG Xing-Min . A STUDY OF DEFECTS DEFECTS IN GaAs BY POSITRON ANNIHILATION. Chinese Physics C, 1986, 10(4): 459-465.
[20]	WANG Shu-Ying . METHOD OF ANALYSING POSITRON ANNIHILATION LIFETIME SPECTRUM WITH A MULTI EXPONENTIAL CURVE FITTING. Chinese Physics C, 1983, 7(4): 408-414.

Access

Get Citation

ZHOU Chun-Lan, WANG Dan-Ni, HE Chuang-Xin, WANG Bao-Yi, WEI Long, HE Qing and JIA Quan-Jie. Study on Pores and Defect by Synthrotron Radiation Small Angle Reflection Method and Slow Positron Annihilation Technique[J]. Chinese Physics C, 2003, 27(S1): 67-71.

RIS(for EndNote,Reference Manager,ProCite)

BibTex

Txt

Milestone

Received: 2003-11-21
Revised: 1900-01-01

Article Metric

Article Views(3231)
PDF Downloads(596)
Cited by(0)

Policy on re-use

To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.

通讯作者: 陈斌, bchen63@163.com

1.
沈阳化工大学材料科学与工程学院沈阳 110142

Study on Pores and Defect by Synthrotron Radiation Small Angle Reflection Method and Slow Positron Annihilation Technique

Corresponding author: ZHOU Chun-Lan,

Institute of High Energy Physics,CAS,Beijing 100039,China

Received Date: 2003-11-21

Accepted Date: 1900-01-01

Available Online: 2003-01-02

Abstract: We measured the X-ray small angle refection (XRR) in Beijing Synchrotron Radiation facility (BSRF) and the Doppler broaden of positron in Beijing slow positron beam with ²²Na radiation source for pore SiO_x(1≤x≤1.6) film prepared by radio-frequency sputtering at different Ar pressures.The result of XRR showed that with the Ar pressures increasing,densities of films were decreasing and porosity were increasing.Positron annihilation result S parameters were decreasing with Ar increasing,this contributed to the paramagnetic defect E' center reducing Ps production.Comparing with the thickness of films with XRR method and slow positron annihilation analyzing program VEPFIT,it showed that the results were consistency and the result of VEPFIT was samller.

HTML

Reference (1)

Study on Pores and Defect by Synthrotron Radiation Small Angle Reflection Method and Slow Positron Annihilation Technique

Abstract：

References

Access

Article Metrics

Metrics

通讯作者: 陈斌, bchen63@163.com

Email This Article