A New Detecting System of the Beam Profile

ZHAO Xiao-Yan; ZHENG Jian-Hua; WANG Yi-Fang; ZHAO Zhi-Zheng; ZU Kai-Ling

Chinese Physics C> 2004, Vol. 28> Issue(11) : 1184-1187

A New Detecting System of the Beam Profile

Institute of Modern Physics,CAS,Lanzhou 730000,ChinaThe Graduate School of Chinese Academy of Sciences,Beijing 100049,China

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Abstract：
A new detecting system of the beam profile used in HIRFL(Heavy Ion Research Facility in Lanzhou) is introduced. The detecting system is based on the residual gas ionization principle and consisted of electrostatic collecting plates, micro-channel plates and a resistive anode. The principle and the construction of the system is described. The on-line experiment results are presented. The non-interceptive diagnostic method by using residual gas ionization to detect beam profile is verified.

References

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ZHAO Xiao-Yan, ZHENG Jian-Hua, WANG Yi-Fang, ZHAO Zhi-Zheng and ZU Kai-Ling. A New Detecting System of the Beam Profile[J]. Chinese Physics C, 2004, 28(11): 1184-1187.

ZHAO Xiao-Yan, ZHENG Jian-Hua, WANG Yi-Fang, ZHAO Zhi-Zheng and ZU Kai-Ling. A New Detecting System of the Beam Profile[J]. Chinese Physics C, 2004, 28(11): 1184-1187. shu

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Received: 2004-03-02
Revised: 1900-01-01

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通讯作者: 陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

A New Detecting System of the Beam Profile

Corresponding author: ZHAO Xiao-Yan,

Institute of Modern Physics,CAS,Lanzhou 730000,ChinaThe Graduate School of Chinese Academy of Sciences,Beijing 100049,China

Received Date: 2004-03-02

Accepted Date: 1900-01-01

Available Online: 2004-11-05

Abstract: A new detecting system of the beam profile used in HIRFL(Heavy Ion Research Facility in Lanzhou) is introduced. The detecting system is based on the residual gas ionization principle and consisted of electrostatic collecting plates, micro-channel plates and a resistive anode. The principle and the construction of the system is described. The on-line experiment results are presented. The non-interceptive diagnostic method by using residual gas ionization to detect beam profile is verified.

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A New Detecting System of the Beam Profile

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