A New Method to Determine the Orientations of Crystal Defects by Synchrotron Radiation

YU Wan-Li; LUO Yong-An; WANG Ming-Zhi; ZHENG Qiu-Ju; ZHANG Hui-Jun; TIAN Yu-Lian; HUANG Wan-Xia

Chinese Physics C> 2001, Vol. 25> Issue(S1) : 110-115

A New Method to Determine the Orientations of Crystal Defects by Synchrotron Radiation

College of Material Science and Engineering,Yanshan University,Qinhuangdao 066004,China2 Institute of High Energy Physics,CAS,Beijing 100039,China

Abstract
HTML
Reference
Related

PDF

Abstract：
A new method was put forward to determine the orientations of crystal defects by synchrotron radiation.Instead of using monochromic radiation as it was done before,a simple method was proposed using white radiation to calculate directions of crystal defects.In order to do so,at least two topographs with different beam incident directions were needed.The direction of an image of a defect should be figured out first.It can be fixed by the angles between the direction of the image and [100],[010]and [001].Suppose the direction of the topograph is [u₁ v₁ w₁]and the direction of the image in the first topograph is [cosα₁₁,cosβ₁₁,cosγ₁₁],α₁₁,β₁₁ and γ₁₁ are the angles between the image and [100],[010] and [001],respectively,then the direction of the defect should be in thd plane with normal n₁=[u₁ v₁ w₁]×[cosα₁₁,cosβ₁₁,cosγ₁₁].Similarly,in the second topograph,the normal of the plane in which the same defect lies is n₂=[u₂ v₂ w₂]×[cosα₁₂,cosβ₁₂,cosγ₁₂],in which [u₂ v₂ w₂] is the direction of the second topograph,α₁₂,β₁₂, and γ₁₂ are the angles between the direction of the image and [100],[010] and [001].Since the defect are normal to n₁ and n₂,its direction n can be calculated out as n=n₁×n₂=[u v w].Using this method,the directions of dislocations in natural diamond were calculated and the types of the dislocations were figured out.

References

[1]

Jenkinson A E. Phil. Tech. Rev., 1961/62, 23: 822 Jenkinson A E, Lang A R. Direct Observation of Imperfections. New York:Interscience, 1962. 4713 Lang A R, Makepeace A P W, Alexander W B et al. Journal of Crystal Growth, 1999, 200(3-4):446-4574 YU Wan-Li, LI Lan-Jie, TIAN Yu-Lian et al. Acta Mineralogica Sinica, 2001,21(1):39-42(in Chinese)(于万里，李兰杰，田玉莲等.矿物学报，2001, 21(1):39-42)5 YU Wan-Li, TAN Yu-Lian, JIANG Jian-Hua et al. Journal of Foundational Materials (in Chinese, in press)(于万里，田玉莲，蒋建华等.功能材料(待发表))6 Ramanan R R, Niranjana S, Goswami N et al. Acta Cryst.,1998, A54:163-1717 Yacoot A, Moreton Moore, Machado W G. J. Appl. Cryst., 1998, 31:767-7768 Machado W G, Moreton Moore, Yacoot A. J. Appl. Cryst., 1998, 31:777-782

[1]	GUO Yun-Jun , HE Kang-Lin . Muon Identification Using the Efficiencies Ratio Method at BESⅡ. Chinese Physics C, 2007, 31(11): 1050-1055.
[2]	CHEN Zhong-Jun , WU Zong-Hua , SUN Ming-Hua , CHEN Xing , CAI Quan , YANG Shi-Shun . Imaging Plate Powder Diffraction System for Synchrotron Radiation. Chinese Physics C, 2005, 29(3): 321-324.
[3]	YANG Kai-Feng , CUI Qi-Liang , MA Yan-Mei , ZHAO Yu , LI Bing , WANG Yi , ZHOU Qiang , LUO Cong-Ju , LIU Jing , ZOU Guang-Tian . Synchrotron Radiation Diffraction of Tellurium Under High Pressure And High Temperature. Chinese Physics C, 2005, 29(S1): 123-125.
[4]	MENG Xian-Zhu . Research of Synchrotron Radiation and Cyclotron Radiation by Virtual Photon Compton Scattering. Chinese Physics C, 2004, 28(8): 898-900.
[5]	LI Zhi-Hui , DAI Jian-Ping , YANG Xue-Ping , FAN Yao-Hui , XIE Jia-Lin , ZHU Jun-Biao . Analysis and Calculation on Electron Bunch Length Measurement by Using CTR. Chinese Physics C, 2003, 27(9): 831-835.
[6]	LUO Yun , HUANG Nan , WEN Xue-Mei . Coupling Measurements and Compensation for BEPC SR Mode. Chinese Physics C, 2003, 27(5): 445-448.
[7]	FENG Xi-Qi , ZHU Wen-Liang , WU Zong-Hua , XIE Ya-Ning . EXAFS Study of Defect Structure in PbWO4 Single Crystals. Chinese Physics C, 2003, 27(S1): 1-4.
[8]	PENG Liang-Qiang , YI Fu-Ting , HAN Yong , ZHANG Ju-Fang . Study on Synchrotron Radiation Lithography at BSRF. Chinese Physics C, 2001, 25(S1): 128-130.
[9]	ZHANG Wei-Wei , CUI Qi-Liang , PANG Yue-Wu , ZHU Pin-Wen , MA Hong-An , ZOU Guang-Tian , LIU Jing , LI Yan-Chun , LI Xiao-Dong . EDXD Study of α-LiIO₃ under High Pressure. Chinese Physics C, 2001, 25(S1): 62-65.
[10]	XU Tong , SHAO Ming , LI Cheng , CHEN Hong-Fang , XU Zi-Zong . Comparison of the Methods Used in the Scintillator γ Spectrum Fitting. Chinese Physics C, 2001, 25(4): 343-347.
[11]	XIE Ya-Ning , LUO Jun , TAO Ye , ZHANG Jing , HU Tian-Dou . New Development of XAFS Experimental Methods at BSRF. Chinese Physics C, 2001, 25(S1): 7-11.
[12]	SHAO Ming , LIU Yan-Wen , ZHANG Zi-Ping , CHEN Hong-Fang . Study on Light Collection Uniformity of Long Lead Tungstate Crystal by Monte Carlo Method. Chinese Physics C, 2001, 25(1): 50-56.
[13]	SHAO Ming , CHEN HongFang , LI Cheng , CHEN Hui , XU ZiZong , WANG ZhaoMin . Testing the Radiation Hardness of Lead Tungstate Scintilating Crystals. Chinese Physics C, 2000, 24(6): 554-559.
[14]	Jiang Jianhua , Wang Zhouguang , Tian Yulian , Wang Gongli , Zhao Yang , Cao Mang , Li Dacheng , , . Study of X-Ray Interference Using Synchrotron Radiation. Chinese Physics C, 1998, 22(8): 763-767.
[15]	Li Yuxiong , Li Juexin , Shao Beibei . The Characteristics of the Radiation Field Around the NSRL and Its Monitoring Method. Chinese Physics C, 1997, 21(1): 81-88.
[16]	Dong Baozhong , Sheng Wenjun , Li Guangcheng , Zhang Zhijie . Small Angle Scattering Station of BEPC Synchrotron Radiation Laboratory. Chinese Physics C, 1995, 19(3): 284-288.
[17]	XIONG Xing-Min . A STUDY OF DEFECTS DEFECTS IN GaAs BY POSITRON ANNIHILATION. Chinese Physics C, 1986, 10(4): 459-465.
[18]	WU Chang-Qin , Song Hao , NI Guang-Jiong . THE HIGHER ORDER QUANTUM CORRECTIONS IN SPIN-FLIP SYNCHROTRON RADIATION. Chinese Physics C, 1984, 8(6): 688-698.
[19]	FANG SHOU-XIAN , GUO ZHI-YUAN , WU YING-ZHI . SYNCHRONOUS TRANSFER OF BEAM IN THE BPS. Chinese Physics C, 1982, 6(4): 495-498.
[20]	FANG SHOU-XIAN . COMPENSATION OF THE SPACE CHARGE FORCE IN A SYNCHROTRON BY MEANS OF RF QUADRUPOLE. Chinese Physics C, 1981, 5(2): 169-175.

Access

Get Citation

YU Wan-Li, LUO Yong-An, WANG Ming-Zhi, ZHENG Qiu-Ju, ZHANG Hui-Jun, TIAN Yu-Lian and HUANG Wan-Xia. A New Method to Determine the Orientations of Crystal Defects by Synchrotron Radiation[J]. Chinese Physics C, 2001, 25(S1): 110-115.

RIS(for EndNote,Reference Manager,ProCite)

BibTex

Txt

Milestone

Received: 1900-01-01
Revised: 1900-01-01

Article Metric

Article Views(3759)
PDF Downloads(501)
Cited by(0)

Policy on re-use

To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.

通讯作者: 陈斌, bchen63@163.com

1.
沈阳化工大学材料科学与工程学院沈阳 110142

A New Method to Determine the Orientations of Crystal Defects by Synchrotron Radiation

Corresponding author: YU Wan-Li,

College of Material Science and Engineering,Yanshan University,Qinhuangdao 066004,China2 Institute of High Energy Physics,CAS,Beijing 100039,China

Received Date: 1900-01-01

Accepted Date: 1900-01-01

Available Online: 2001-06-22

Abstract: A new method was put forward to determine the orientations of crystal defects by synchrotron radiation.Instead of using monochromic radiation as it was done before,a simple method was proposed using white radiation to calculate directions of crystal defects.In order to do so,at least two topographs with different beam incident directions were needed.The direction of an image of a defect should be figured out first.It can be fixed by the angles between the direction of the image and [100],[010]and [001].Suppose the direction of the topograph is [u₁ v₁ w₁]and the direction of the image in the first topograph is [cosα₁₁,cosβ₁₁,cosγ₁₁],α₁₁,β₁₁ and γ₁₁ are the angles between the image and [100],[010] and [001],respectively,then the direction of the defect should be in thd plane with normal n₁=[u₁ v₁ w₁]×[cosα₁₁,cosβ₁₁,cosγ₁₁].Similarly,in the second topograph,the normal of the plane in which the same defect lies is n₂=[u₂ v₂ w₂]×[cosα₁₂,cosβ₁₂,cosγ₁₂],in which [u₂ v₂ w₂] is the direction of the second topograph,α₁₂,β₁₂, and γ₁₂ are the angles between the direction of the image and [100],[010] and [001].Since the defect are normal to n₁ and n₂,its direction n can be calculated out as n=n₁×n₂=[u v w].Using this method,the directions of dislocations in natural diamond were calculated and the types of the dislocations were figured out.

HTML

Reference (1)

A New Method to Determine the Orientations of Crystal Defects by Synchrotron Radiation

Abstract：

References

Access

Article Metrics

Metrics

通讯作者: 陈斌, bchen63@163.com

Email This Article