New Methods to Measure Integrated Luminosity at BES

HUANG GuangShun; CHENG BaoSen; YUAN ChangZheng; LI XinHua; QIXiangRong; LIU Jing; CHEN GuangPei; CHEN JiangChuan; HU HaiMing; HU Tao; JU Xin; LI Jin; MAO ZePu; XUE ShengTian; ZHANG LiangSheng; ZHENG ZhiPeng; ZHOU Li; ZHAO ZhengGuo

Chinese Physics C> 2000, Vol. 24> Issue(5) : 373-378

New Methods to Measure Integrated Luminosity at BES

Institute of High Energy Physics,CAS,Beijing 100039,China

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Abstract：
Two new methods are introduced for the first time at BES to measure the integrated luminosity from events in large angle produced by QED dimuon and two-gamma production processes. With these methods,the integrated luminosities of the 6 energy points at 2.6,3.2,3.4,3.55,4.6 and 5.0 GeV scanned for the measurement of R are determined. The measured integrated luminosities are consistent with that determined using large angle Bhabha events.

References

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HUANG GuangShun, CHENG BaoSen, YUAN ChangZheng, LI XinHua, QIXiangRong, LIU Jing, CHEN GuangPei, CHEN JiangChuan, HU HaiMing, HU Tao, JU Xin, LI Jin, MAO ZePu, XUE ShengTian, ZHANG LiangSheng, ZHENG ZhiPeng, ZHOU Li and ZHAO ZhengGuo. New Methods to Measure Integrated Luminosity at BES[J]. Chinese Physics C, 2000, 24(5): 373-378.

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Received: 1999-05-12
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

New Methods to Measure Integrated Luminosity at BES

Corresponding author: HUANG GuangShun,

Institute of High Energy Physics,CAS,Beijing 100039,China

Received Date: 1999-05-12

Accepted Date: 1900-01-01

Available Online: 2000-04-05

Abstract: Two new methods are introduced for the first time at BES to measure the integrated luminosity from events in large angle produced by QED dimuon and two-gamma production processes. With these methods,the integrated luminosities of the 6 energy points at 2.6,3.2,3.4,3.55,4.6 and 5.0 GeV scanned for the measurement of R are determined. The measured integrated luminosities are consistent with that determined using large angle Bhabha events.

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New Methods to Measure Integrated Luminosity at BES

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