Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs

Zhen-Lei Yang; Xiao-Hui Wang; Zhan-Gang Zhang; Jie Liu; Hong Su

doi:10.1088/1674-1137/40/4/046103

Chinese Physics C> 2016, Vol. 40> Issue(4) : 046103 DOI: 10.1088/1674-1137/40/4/046103

Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs

1.
Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
2.
University of Chinese Academy of Sciences, Beijing 100049, China
3.
Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
4.
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou 510610, China

Abstract
HTML
Reference
Related

PDF

Abstract：
Embedded RAM blocks(BRAMs) in field programmable gate arrays(FPGAs) are susceptible to single event effects(SEEs) induced by environmental factors such as cosmic rays, heavy ions, alpha particles and so on. As technology scales, the issue will be more serious. In order to tackle this issue, two different error correcting codes(ECCs), the shortened Hamming codes and shortened BCH codes, are investigated in this paper. The concrete design methods of the codes are presented. Also, the codes are both implemented in flash-based FPGAs. Finally, the synthesis report and simulation results are presented in the paper. Moreover, heavy-ion experiments are performed, and the experimental results indicate that the error cross-section of the device using the shortened Hamming codes can be reduced by two orders of magnitude compared with the device without mitigation, and no errors are discovered in the experiments for the device using the shortened BCH codes.
- single event effects ,
- flash-based FPGAs ,
- BRAMs ,
- error correcting codes ,
- Hamming codes ,
- BCH codes

References

[1]	S. Rezgui, J. J. Wang, Y. Sun, et al, IEEE Trans. Nucl. Sci., 55:3328-3335(2008)
[2]	N. Battezzati, S. Gerardin, A. Manuzzato, et al, IEEE Trans. Nucl. Sci., 56:3534-3541(2009)
[3]	S. Y. Yang, Z. Cao, D. A. Da, et al, Chin. Phys. C, 33(05):369-373(2009)
[4]	P. E. Dodd, M. R. Shaneyfelt, J. R. Schwank, et al, IEEE Trans. Nucl. Sci., 57:1747-1763(2010)
[5]	M. Nicolaidis, Soft errors in modern electronic systems, Springer Science Business Media, 2010
[6]	S. Rezgui, J. McCollum, R. Won, et al, IEEE Trans. Nucl. Sci., 57:3716-3724(2010)
[7]	S. Rezgui, J. J. Wang, E. C. Tung, et al, IEEE Trans. Nucl. Sci., 54:2512-2524(2007)
[8]	Y. B. Li, B. Nelson, M. Wirthlin, et al, IEEE Trans. Nucl. Sci., 60:2720-2727(2013)
[9]	B. Varghese, S. Sreelal, P. Vinod, et al, Information Communication Technologies(ICT), 2013 IEEE Conference on, 2013. 1086-1090
[10]	P. Y. Chen, Y. T. Yeh, C. H. Chen, et al, in Test Conference, 2006, ITC'06, IEEE International, 2006. 1-10
[11]	K. Namba, S. Pontarelli, M. Ottavi, et al, IEEE Trans. Devi. Mate Reliability., 14:664-671(2014)
[12]	S. Liu, G. Sorrenti, P. Reviriego, et al, IEEE Trans. Nucl. Sci., 59:619-624(2012)
[13]	S. F. Liu, P. Reviriego, J. A. Maestro, et al, IEEE Trans. Nucl. Sci., 57:2112-2118(2010)
[14]	R. Naseer, J. Draper, in Electronics, Circuits and Systems, 2008. ICECS 2008. 15th IEEE International Conference on, 2008. 586-589
[15]	R. Naseer, J. Draper, in Solid-State Circuits Conference, 2008. ESSCIRC 2008. 34th European, 2008. 222-225
[16]	W. J. Ma, X. L. Cui, C. L. Lee, in ASIC(ASICON), 2013 IEEE 10th International Conference on, 2013, 1-4
[17]	S. Lin, D. J. Costello, Error Control Coding, Second Edition, Prentice-Hall, 2004
[18]	R. W. Hamming, Bell System Technical Journal., 29:147-160(1950)
[19]	M. Y. Hsiao, IBM Journal of Research and Development., 14:395-401(1970)
[20]	X. H. Wang, T. Tong, H. Su et al, Nucl Sci Tech, 26:030401(2015)

[1]	Nian Qin , Zhen-Yu Zhang , Shuang-Shi Fang , Xiang Zhou , Lin-Lin Du , Hao-Xue Qiao . Event generators for η/η' decays at BESⅢ. Chinese Physics C, 2018, 42(1): 013001. doi: 10.1088/1674-1137/42/1/013001
[2]	Xiang-Ru Yu , Jing Hu , Xiao-Xue Li , Si-Yu An , Yu Zhang . Effects of single particle on shape phase transitions and phase coexistence in odd-even nuclei. Chinese Physics C, 2018, 42(3): 034103. doi: 10.1088/1674-1137/42/3/034103
[3]	Yi Wang , Qin Li , Nan Chen , Jin-Ming Cheng , Yu-Tong Xie , Yun-Long Liu , Quan-Hong Long . Spot size measurement of a flash-radiography source using the pinhole imaging method. Chinese Physics C, 2016, 40(7): 076202. doi: 10.1088/1674-1137/40/7/076202
[4]	Kai Xi , Chao Geng , Zhan-Gang Zhang , Ming-Dong Hou , You-Mei Sun , Jie Luo , Tian-Qi Liu , Bin Wang , Bing Ye , Ya-Nan Yin , Jie Liu . Monte Carlo predictions of proton SEE cross-sections from heavy ion test data. Chinese Physics C, 2016, 40(6): 066001. doi: 10.1088/1674-1137/40/6/066001
[5]	Shan-Shan Gao , Di Jiang , Chang-Qing Feng , Kai Xi , Shu-Bin Liu , Qi An . Single event effect hardness for the front-end ASICs in the DAMPE satellite BGO calorimeter. Chinese Physics C, 2016, 40(1): 016102. doi: 10.1088/1674-1137/40/1/016102
[6]	HUANG Liang-Sheng , Yoshiro Irie , LIU Yu-Dong , WANG Sheng . Mode error analysis of impedance measurement using twin wires. Chinese Physics C, 2015, 39(3): 037003. doi: 10.1088/1674-1137/39/3/037003
[7]	PING Rong-Gang . An exclusive event generator for e⁺e^- scan experiments. Chinese Physics C, 2014, 38(8): 083001. doi: 10.1088/1674-1137/38/8/083001
[8]	MENG Cai , LI Zhi-Hui , TANG Jing-Yu . Error analysis and lattice improvement for the C-ADS Injector-Ⅰ. Chinese Physics C, 2014, 38(6): 067008. doi: 10.1088/1674-1137/38/6/067008
[9]	HU Ying , FENG Ke-Xin , ZHANG Wei-Ning . Source function extracted from single-event HBT correlation functions of hydrodynamical sources. Chinese Physics C, 2014, 38(4): 044102. doi: 10.1088/1674-1137/38/4/044102
[10]	GENG Chao , LIU Jie , ZHANG Zhan-Gang , XI Kai , GU Song , HOU Ming-Dong , SUN You-Mei , DUAN Jing-Lai , YAO Hui-Jun , MO Dan , LUO Jie . Modeling the applicability of linear energy transfer on single event upset occurrence. Chinese Physics C, 2013, 37(6): 066001. doi: 10.1088/1674-1137/37/6/066001
[11]	PEI Shi-Lun , LI Xiao-Ping , XIAO Ou-Zheng . Error and jitter e ect studies on the SLED for the BEPCⅡ-linac. Chinese Physics C, 2012, 36(5): 456-463. doi: 10.1088/1674-1137/36/5/014
[12]	LI Cheng-Gang , LI Qin , SHI Jin-Shui , DENG Jian-Jun . Spot size diagnostics for flash radiographic X-ray sources at LAPA. Chinese Physics C, 2009, 33(S2): 157-160. doi: 10.1088/1674-1137/33/S2/041
[13]	ZHANG Hui-Hui , SHEN Hua-Jun , ZHOU Jing-Tao , LIU Xin-Yu . Photon higher-order squeezing effects of the q analogue of a single-mode field interacting with a Ξ-type three-level atom. Chinese Physics C, 2009, 33(8): 622-625. doi: 10.1088/1674-1137/33/8/004
[14]	YANG Shi-Yu , CAO Zhou , DA Dao-An , XUE Yu-Xiong . Equivalent properties of single event burnout induced by different sources. Chinese Physics C, 2009, 33(5): 369-373. doi: 10.1088/1674-1137/33/5/010
[15]	FU Cheng-Dong , ZOU Jia-Heng , MO Xiao-Hu , HE Kang-Lin , BIAN Jian-Ming , CAO Guo-Fu , CAO Xue-Xiang , CHEN Shen-Jian , DENG Zi-Yan , GAO Yuan-Ning , HE Miao , HUA Chun-Fei , HUANG Bin , HUANG Xing-Tao , JI Xiao-Bin , LI Fei , LI Hai-Bo , LI Wei-Dong , LIANG Yu-Tie , LIU Chun-Xiu , LIU Huai-Min , LIU Qiu-Guang , LIU Suo , LIU Ying-Jie , MA Qiu-Mei , MA Xiang , MAO Ya-Jun , MAO Ze-Pu , PAN Ming-Hua , PANG Cai-Ying , PING Rong-Gang , QIN Gang , QIN Ya-Hong , QIU Jin-Fa , SUN Sheng-Sen . Study of the online event filtering algorithm for BESⅢ. Chinese Physics C, 2008, 32(5): 329-337. doi: 10.1088/1674-1137/32/5/001
[16]	MA Xiang . Determination of event start time at BESⅢ. Chinese Physics C, 2008, 32(9): 744-749. doi: 10.1088/1674-1137/32/9/012
[17]	PING Rong-Gang . Event generators at BESⅢ. Chinese Physics C, 2008, 32(8): 599-602. doi: 10.1088/1674-1137/32/8/001
[18]	LU Jian-Qin , LI Jin-Hai . Computer Codes for the Beam Optics Calculations —Third Order Approximation. Chinese Physics C, 2006, 30(S1): 25-27.
[19]	HOU Ming-Dong , ZHANG Qing-Xiang , LIU Jie , WANG Zhi-Guang , JIN Yun-Fan , ZHU Zhi-Yong , ZHEN Hong-Lou , LIU Chang-Long , CHEN Xiao-Xi , WEI Xin-Guo , ZHANG Lin , FAN You-Cheng , , . Single Event Effects Induced by 15.14 MeV/u ¹³⁶Xe Ions. Chinese Physics C, 2002, 26(9): 904-908.
[20]	Yang Changgen , Chen Hesheng , Jin Bingnian , Tang Xiaowei , M. Pohi . Fitting Method and Error Study for Tau Lifetime Measurement of L3 Experiment. Chinese Physics C, 1994, 18(S3): 243-250.

Access

Get Citation

Zhen-Lei Yang, Xiao-Hui Wang, Zhan-Gang Zhang, Jie Liu and Hong Su. Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs[J]. Chinese Physics C, 2016, 40(4): 046103. doi: 10.1088/1674-1137/40/4/046103

RIS(for EndNote,Reference Manager,ProCite)

BibTex

Txt

Milestone

Received: 2015-07-22

Fund

Supported by National Natural Science Foundation of China(11079045, 11179003 and 11305233)}

Article Metric

Article Views(1448)
PDF Downloads(18)
Cited by(0)

Policy on re-use

To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.

通讯作者: 陈斌, bchen63@163.com

1.
沈阳化工大学材料科学与工程学院沈阳 110142

Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs

Abstract：

References

Access

Article Metrics

Metrics

通讯作者: 陈斌, bchen63@163.com

Email This Article

Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs

Corresponding author: Hong Su,

HTML

目录