Tritium and helium analyses in thin films by enhancedproton backscattering

FU Tao; AN Zhu; ZHU Jing-Jun; LIU Man-Tian; MAO Li

doi:10.1088/1674-1137/38/8/088203

Chinese Physics C> 2014, Vol. 38> Issue(8) : 088203 DOI: 10.1088/1674-1137/38/8/088203

Tritium and helium analyses in thin films by enhancedproton backscattering

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In order to study how to reliably perform quantitative tritium and helium analyses in thin film samples using enhanced proton backscattering (EPBS), several EPBS spectra for some samples consisting of non-RBS light elements (i.e., T, ⁴He, ¹²C, ¹⁶O, ^natSi), medium and heavy elements have been measured and analyzed using analytical SIMNRA and Monte Carlo-based CORTEO codes. The non-RBS cross sections needed in the CORTEO code are taken from the ENDF/B-Ⅶ.1 database and the calculations of SigmaCalc code and are incorporated into the CORTEO code. All non-RBS cross section data over the entire proton incident energy-scattering angle plane are obtained by interpolation. It is quantitatively observed that in EPBS analysis the multiple and plural scattering effects have little impact on the energy spectra for light elements and the RBS cross sections of light elements can be used in the SIMNRA code for dual scattering calculations. It is also observed that the results given by the CORTEO code are higher than the results of the SIMNRA code in the low energy part of EPBS spectra, and are in better agreement with the experimental data. Tritium and helium analyses in thin film samples using EPBS can be performed reliably when the multiple and plural scattering contributions are completely accounted.

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FU Tao, AN Zhu, ZHU Jing-Jun, LIU Man-Tian and MAO Li. Tritium and helium analyses in thin films by enhancedproton backscattering[J]. Chinese Physics C, 2014, 38(8): 088203. doi: 10.1088/1674-1137/38/8/088203

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Received: 2013-10-14
Revised: 1900-01-01

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通讯作者: 陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

Tritium and helium analyses in thin films by enhancedproton backscattering

Corresponding author: AN Zhu,

Corresponding author: ZHU Jing-Jun,

Received Date: 2013-10-14

Accepted Date: 1900-01-01

Available Online: 2014-08-05

Abstract: In order to study how to reliably perform quantitative tritium and helium analyses in thin film samples using enhanced proton backscattering (EPBS), several EPBS spectra for some samples consisting of non-RBS light elements (i.e., T, ⁴He, ¹²C, ¹⁶O, ^natSi), medium and heavy elements have been measured and analyzed using analytical SIMNRA and Monte Carlo-based CORTEO codes. The non-RBS cross sections needed in the CORTEO code are taken from the ENDF/B-Ⅶ.1 database and the calculations of SigmaCalc code and are incorporated into the CORTEO code. All non-RBS cross section data over the entire proton incident energy-scattering angle plane are obtained by interpolation. It is quantitatively observed that in EPBS analysis the multiple and plural scattering effects have little impact on the energy spectra for light elements and the RBS cross sections of light elements can be used in the SIMNRA code for dual scattering calculations. It is also observed that the results given by the CORTEO code are higher than the results of the SIMNRA code in the low energy part of EPBS spectra, and are in better agreement with the experimental data. Tritium and helium analyses in thin film samples using EPBS can be performed reliably when the multiple and plural scattering contributions are completely accounted.

Tritium and helium analyses in thin films by enhancedproton backscattering

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