• [1]

    . PEI Yuan-Ji. The Simulation and Analysis of Secondary Emission Microwave Electron Gun. Proceedings of the Second Asian Particle Accelerator Conference. 5622. Srinivasan-Rao T. Novel Single Shot Scheme to Measure Sub Millimeter Electron Bunch Lengths Using Electro-optic Technique. Physical Review Special Topic-Accelerators And Beams, 2002, 5: 0428013. Valdmanis J A, Mourou G. Subpicosecond Electrooptic Sampling: Principles and Applications. IEEE Journal of Quantum Electroics, 1986, QE-22(1): 69-784. Lumpkin A H, Yang B X, Berg W J. Utilization of CTR to Measurement the Evolution of Electron-Beam Microbunching in a SASE FEL. Proceedings of FEL 2000 and NIMA5. Lumpkin A H, Sereno N S, Rule D W. First Measurement of Subpicosecond Beam Structure by Autocorrelation of CDR.Proceedings of FEL 2000 and NIMA